Microscopy has come a long way since the time of Leeuwenhoek and Hooke, who developed the early optical microscopy. With the increasing complexity of materials systems, it is essential to continue to develop microscopy techniques and analysis in the broadest sense. This includes not only real-space imaging, spectroscopy and reciprocal-space diffraction, but also localized measurements of their evolution, properties and phenomena.
We are particularly active in this area by implementing and developing a broad suite of characterization techniques based on electron, photon (light and synchrotron), ion and scanning probe techniques.
We make extensive use of the NUANCE center capabilities and develop innovative techniques for exploring the "inner" space.
We are also active in developing in-situ and ex-situ characterization techniques based on electron microscopy, diffraction, spectroscopy, as well as scanning probe and synchrotron x-ray scattering.
Representative Publications:
- Shekhawat G, Dravid VP, "Nanoscale imaging of buried structures via scanning near-field ultrasound holography", Science, 310 (5745): 89-92 (2005).
- Su M, Dravid VP et al., "Locally enhanced relative humidity for scanning probe nanolithography", Langmuir, 21 (24):10902-10906 (2005).
- Donthu SK, Dravid VP et al., "Near-field scanning optical microscopy of ZnO nanopatterns fabricated by micromolding in capillaries", J. Appl. Phys., 98 (2): Art. No. 024304 (2005).
Links to Other Dravid Group Research Themes: