Interfaces & Defect Phenomena

 

(Supported by NSF-MRSEC, DOE-BES, SRC, Intel, NSF-MRI, NSF-NSEC, ANL)


Interfaces and defects are ubiquitous in modern materials systems and devices. In particular, multifunctional materials properties and phenomena are inevitably influenced by complex interfacial and defect structures.

In this research theme, we tailor model and functional interfaces and analyze them extensively using advanced microscopy, scanning probe and synchrotron x-ray scattering. We monitor the dynamics of interfacial and defect phenomena using in-situ characterization techniques, and measure their localized and bulk properties.

Of particular recent interest are interfaces in multifunctional oxides, comprising synergistic ferroelectric, ferromagnetic and optical properties and interfaces in nanopattern-substrate systems.

We make extensive use of NUANCE center and ANL-APS synchrotron scattering facilities for both, ex-situ and in-situ analysis of statics and dynamics of interfacial and defect phenomena.

Representative Publications:

  1. Prabhumirashi P, Dravid VP, et al., "Atomic-scale manipulation of potential barriers at SrTiO3 grain boundaries", Appl. Phys. Lett., 87 (12) 121917 (2005)
  2. Alem N, Dravid VP, "Interfacial fracture phenomena in ceramic composite directionally solidified eutectics with a ductile interphase", J. Amer. Ceram. Soc., 89 (2): 767-772 (2006)
  3. Brewer LN, Dravid VP, "Interfacial fracture mechanisms in solid solution directionally solidified eutectic oxide composites", Acta Met., 52 (13): 3781-3791 (2004)

 

Links to Other Dravid Group Research Themes:

Spatially and Dimensionally Confined Structures
Synthesis, Patterning and Microscopy of Nanostructures
Integrated Nanosystems for Biochemical Sensing & Diagnostics
Multifunctional Nanostructures for Biomedical Imaging & Therapeutics
Novel microscopy and Analysis

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