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Sujing Xie, Ph.D.

EPIC, NUANCE Center,
Northwestern University
Cook Hall, Rm 1161

Phone: (847) 491-6774
Facsimile: (847) 467-6573

Email: s-xie@northwestern.edu

 
 

 

Educational Background

Current: Northwestern University, Postdoc Fellow, Materials Science and Engineering
Previous: Ph.D. in Materials Science and Engineering, University of Tennessee, Knoxville

 
 

 

Research Interest

  1. Characterize the interface structure of magnetic and ferroelectric oxides by atomic-resolution Z-contrast imaging, EELS, GIF element mapping, EDS and HREM.
  2. Investigate the growth mechanism of thin films and nanowires by various advanced S/TEM techniques.
  3. Explore the processing-structure-property relationship of crystalline and non-crystalline metals and intermetallics.
  4. Understand deformation mechanism of nanostructured/amorphous alloys by TEM, SEM, AFM and mechanical testing machines.

 
 

 

Results

 
 

 

Future Directions

  • Atomic resolution 3D-tomography and 3D-reconstruction
  • Aberration-corrected STEM imaging and atomic-scale EELS mapping
  • In-situ TEM to investigate the deformation mechanism of nanotwins, and the magnetoelectric coupling of multiferroic thin films and nanopatterns.

 
 

 

Selected Publications


S. Xie, J. Cheng, B.W. Wessels, V.P. Dravid, Interfacial structure and chemistry of CoFe2O4 thin films on SrTiO3 and MgO substrates", Applied Physics Letters, 93, 181901, 2008.

S. Xie and E.P. George, "Evolution of hardness and shear band patterns in bulk metallic glasses after plastic deformation and annealing", Acta Materialia, 56, 5202, 2008.

H. Bei, S. Xie and E.P. George, "Softening caused by profuse shear banding in a bulk metallic glass", Physical Review Letters, 96(10), 105503, 2006.



 

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